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Wavevector resonance modulation in multilayered nanostructures for sub-λ/10 label-free super-resolution imaging 认领 引用
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作者 Haonan Zhang Xiaoyu Yang +6 位作者 Mingwei Tang Conghui Gan Feihong Lin Emiliano Descrovi Tao Li Xu Liu Qing Yang 《Advanced Photonics Nexus》 CSCD 2026年第4期80-89,共10页
Label-free super-resolution imaging based on the spatial-frequency-shift(SFS)effect enables conventional microscopes to surpass the diffraction limit,holding significant promise for nanoscale inspection in materials s... Label-free super-resolution imaging based on the spatial-frequency-shift(SFS)effect enables conventional microscopes to surpass the diffraction limit,holding significant promise for nanoscale inspection in materials science and biology.However,current SFS approaches generally face a practical trade-off in obtaining both the ultra-high resolution and the high signal-to-noise ratio(SNR)when using high lateral wavevector(kx)illumination supported by a natural waveguide or single metal film.Here,we proposed a wavevector resonance modulation scheme in multilayered nanostructures that introduces an enhanced deep SFS effect,which is realized by surface plasmon polariton illumination supported by a designed multilayer with relaxed fabrication tolerance.This approach simultaneously achieves a peak-topeak distance of∼70 nm under the excitation wavelength of 780 nm,a resonance-enhanced illumination field,and a more than 10-fold expansion for the coherent transfer function(CTF).We demonstrated the simple excitation process by means of gratings and presented an application in nano-imaging experiments for label-free particles.Results show the advance in the resonance-enhanced illumination modulation method for super-resolution imaging,enabling conventional microscopes to detect and distinguish label-free nanoscale structures with characteristic lateral scales down to sub-λ∕10. 展开更多
关键词 wavevector modulation resonance enhancement deep spatial-frequency-shift super resolution imaging label-free imaging
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